Kaohsiung, Taiwan

Chieh-Yi Lo

This inventor holds 3 USPTO granted patents. Top assignee: Industrial Technology Research Institute. Active years: 2003-2024.


% Patents Active = 66.7

Average Co-Inventor Count = 4.5

ph-index = 1


Company Filing History:


Years Active: 2003-2024

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3 patents (USPTO):Explore Patents

Title: Chieh-Yi Lo: Innovator in Heterogeneous Integration and LED Inspection Technologies

Introduction

Chieh-Yi Lo is a prominent inventor based in Kaohsiung, Taiwan. He has made significant contributions to the fields of heterogeneous integration and light-emitting diode (LED) inspection technologies. With a total of 3 patents to his name, Lo continues to push the boundaries of innovation in his field.

Latest Patents

Chieh-Yi Lo's latest patents include a heterogeneous integration detecting method and apparatus. This method involves maintaining the same relative distance between an interference objective lens and a sample while continuously adjusting the relative posture of the lens according to changes in the sample's image. The goal is to determine the optical axis of the lens to be perpendicular to the sample's surface. Additionally, he has developed an inspection apparatus for inspecting LED wafers. This apparatus features a Z-axis translation stage, a sensing probe, and a height measurement module, among other components, to facilitate accurate inspections of LED technology.

Career Highlights

Lo is affiliated with the Industrial Technology Research Institute, where he applies his expertise to advance research and development in technology. His work has been instrumental in enhancing the efficiency and accuracy of inspection methods in the semiconductor industry.

Collaborations

Some of Chieh-Yi Lo's notable coworkers include Hsiang-Chun Wei and Chih-Hsiang Liu. Their collaborative efforts contribute to the innovative projects at the Industrial Technology Research Institute.

Conclusion

Chieh-Yi Lo stands out as a key figure in the realm of technological innovation, particularly in heterogeneous integration and LED inspection. His patents reflect a commitment to advancing technology and improving inspection methodologies.

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