Chieh Ting Yeh

Title: Chieh Ting Yeh: Innovator in Outlier Detection Technology

Introduction

Chieh Ting Yeh is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of outlier detection through his innovative patent. His work focuses on enhancing the analysis of metric data in computing resources.

Latest Patents

Chieh Ting Yeh holds a patent for "Point-in-time relative outlier detection." This patent discloses techniques for performing point-in-time relative outlier detection. The outlier detection system analyzes metric data based on the values detected on a computing resource, relative changes between different metric readings, and absolute changes relative to a specific point in time. The system predicts anomalous behavior by applying a set of machine-learning (ML) models to the point-in-time values. These ML models enable the system to make inferences and adjustments during application runtime, rather than relying on static instruction sets. The models may implement unsupervised learning methods, allowing for point-in-time classification without requiring historical metric data.

Career Highlights

Chieh Ting Yeh is currently employed at Oracle International Corporation, where he continues to develop and refine his innovative technologies. His work at Oracle has positioned him as a key player in the advancement of outlier detection systems.

Collaborations

Chieh has collaborated with talented coworkers, including Yufei Liu and May Bich Nhi Lam, contributing to the development of cutting-edge technologies in their field.

Conclusion

Chieh Ting Yeh's contributions to outlier detection technology demonstrate his innovative spirit and commitment to advancing computing resource analysis. His patent reflects a significant step forward in the application of machine learning for real-time data analysis.