Taipei, Taiwan

Chieh-Chih Wang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Industrial Technology Research Institute. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chieh-Chih Wang. Retrieved from https://idiyas.com/inventor/chieh-chih-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Chieh-Chih Wang: Innovator in Position Estimation Technologies

Introduction

Chieh-Chih Wang is an inventor based in Taipei City, Taiwan. He has made significant contributions to the field of position estimation technologies. His innovative approach focuses on developing systems and methods that enhance the accuracy of position estimation.

Latest Patent Applications

Chieh-Chih Wang's notable patent application is titled "Position Estimation Apparatuses and Systems and Position Estimation Methods Thereof." This application describes a position estimation system that includes at least one measurement unit, multiple evaluation units, and a particle filter. The measurement unit obtains first information, which includes motion information and a corresponding noise model of a traced object. Each evaluation unit has a corresponding evaluation model that generates unit displacement estimations based on the first information. The particle filter samples and generates multiple displacement estimations according to the unit displacement estimations and the corresponding noise models.

Conclusion

Chieh-Chih Wang's work in position estimation systems showcases his innovative spirit and dedication to advancing technology in this field. His contributions have the potential to impact various applications that rely on accurate position estimation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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