Chieh-Cheng Liao

Title: Chieh-Cheng Liao: Innovator in Panoramic Camera Technology

Introduction

Chieh-Cheng Liao is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of camera technology, particularly in the area of panoramic imaging. His innovative approach has led to the development of a unique testing device and method that enhances the quality of panoramic images.

Latest Patents

Chieh-Cheng Liao holds a patent for a "Testing device and testing method for detecting stitching defect of panoramic camera." This invention provides a systematic approach to identifying stitching defects in panoramic images. The method involves accessing the panoramic camera to obtain a stitched image, which includes a chart image with multiple black and white stripes. By generating a defect image marked with the stitching defect according to the chart image, the testing device outputs a clear representation of any issues present.

Career Highlights

Chieh-Cheng Liao is currently associated with Aspeed Technology Inc., where he continues to innovate and contribute to advancements in camera technology. His work focuses on improving the accuracy and reliability of panoramic imaging systems, which are increasingly used in various applications, including virtual reality and surveillance.

Conclusion

Chieh-Cheng Liao's contributions to the field of panoramic camera technology demonstrate his commitment to innovation and quality. His patent reflects a significant advancement in detecting stitching defects, which is crucial for enhancing the overall performance of panoramic cameras.