The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2025
Filed:
Jan. 16, 2022
Applicant:
Aspeed Technology Inc., Hsinchu, TW;
Inventor:
Chieh-Cheng Liao, Hsinchu, TW;
Assignee:
ASPEED Technology Inc., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G06T 5/30 (2006.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01); H04N 23/56 (2023.01); H04N 23/698 (2023.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06T 5/30 (2013.01); G06T 5/70 (2024.01); G06T 7/0002 (2013.01); H04N 23/698 (2023.01); G06T 2207/20036 (2013.01); G06T 2207/30168 (2013.01); H04N 23/56 (2023.01);
Abstract
A testing device and a testing method for detecting a stitching defect of a panoramic camera are provided. The testing method includes: accessing the panoramic camera to obtain a stitched image, wherein the stitched image includes a chart image corresponding to a chart, wherein the chart includes multiple black stripes and multiple white stripes; generating a defect image marked with the stitching defect according to the chart image; and outputting the defect image.