Taipei, Taiwan

Chia-Wen Lo

This inventor holds 1 USPTO granted patent. Top assignees: National Applied Research Laboratories, National Taiwan University. Active years: 2018.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Chia-Wen Lo: Innovator in Fluorescence Imaging Technology

Introduction

Chia-Wen Lo is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of fluorescence imaging technology. His innovative work has led to the development of a unique system that enhances the analysis and synthesis of fluorescence images.

Latest Patents

Chia-Wen Lo holds 1 patent for his invention titled "Fluorescence intensity analyzing and fluorescence image synthesizing system." This patent describes a system and method that utilizes two fluorescence intensity detection devices. The first device detects a series of first fluorescence intensities, while the second device captures a series of second fluorescence intensities. The data from these devices is then processed to synthesize a comprehensive image that highlights the fluorescence target range.

Career Highlights

Throughout his career, Chia-Wen Lo has worked with prestigious institutions such as National Taiwan University and National Applied Research Laboratories. His work in these organizations has allowed him to advance his research and contribute to the scientific community.

Collaborations

Chia-Wen Lo has collaborated with several talented individuals, including Min-Yu Lin and Chi-Hung Huang. These collaborations have enriched his research and fostered innovation in his field.

Conclusion

Chia-Wen Lo's contributions to fluorescence imaging technology exemplify the impact of innovative thinking in scientific research. His patented system represents a significant advancement in the analysis and synthesis of fluorescence images, showcasing his dedication to enhancing imaging technology.

Profile summary based on public USPTO records.
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