Taipei, Taiwan

Chia-Wei Sun

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chia-Wei Sun. Retrieved from https://idiyas.com/inventor/chia-wei-sun-ginqnnzb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2011

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Chia-Wei Sun: Innovator in Optical Scanning Technology

Introduction

Chia-Wei Sun is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical technology, particularly with his innovative designs and patents. His work is recognized for its potential applications in various industries.

Latest Patents

Chia-Wei Sun holds a patent for an optical scanning probe. This invention includes a housing, a diaphragm, a rotor, a conduit, an optical fiber module, and a reflector. The diaphragm and housing form a chamber, while the rotor is movably disposed within it and features several fans. The conduit conducts fluid into the chamber, impelling the fans and rotor. The optical fiber module transmits a light beam through the diaphragm, and the reflector rotates with the rotor to enable 360° scanning.

Career Highlights

Chia-Wei Sun is affiliated with the Industrial Technology Research Institute, where he has been instrumental in advancing optical scanning technologies. His work has garnered attention for its innovative approach and practical applications.

Collaborations

Chia-Wei Sun has collaborated with notable colleagues, including Chih-Wei Lu and Gwo-Bin Lee. These partnerships have contributed to the development of cutting-edge technologies in their field.

Conclusion

Chia-Wei Sun is a key figure in the realm of optical technology, with a focus on innovative scanning solutions. His contributions continue to influence advancements in this area, showcasing the importance of his work in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…