This inventor holds 1 USPTO granted patent. Top assignee: Chung-Shan Institute of Science and Technology. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Chia-Hau Lin: Innovator in Three-Dimensional Measurement Technology
Introduction
Chia-Hau Lin is a notable inventor based in Jhunan, Taiwan. He has made significant contributions to the field of measurement technology, particularly in the development of methods for capturing three-dimensional profiles.
Latest Patents
Chia-Hau Lin holds a patent for a measurement method of three-dimensional profiles and a reconstruction system utilizing subpixel localization with color gratings and picture-in-picture switching on a single display. This innovative method includes several steps: preparation, projection, image extraction, image fine-tuning, image processing, and reconstruction. The system features a projection apparatus that emits a grating towards the workpiece, forming a grating image with identical contrast values for easier identification. Additionally, a central processing unit fine-tunes and reconstructs the three-dimensional profiles using the grating image and a switchable picture-in-picture display.
Career Highlights
Chia-Hau Lin is currently employed at the Chung-Shan Institute of Science and Technology, Armaments Bureau, Ministry of National Defense. His work focuses on advancing measurement technologies that enhance precision and efficiency in various applications.
Collaborations
Throughout his career, Chia-Hau Lin has collaborated with esteemed colleagues, including Chern-Sheng Lin and Jyh-Fa Lee. These collaborations have contributed to the development of innovative solutions in measurement technology
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile