Shenzhen, China

Chi Yuen Lau

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Ap Photonics (Shen Zhen) Limited. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chi Yuen Lau. Retrieved from https://idiyas.com/inventor/chi-yuen-lau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations of Chi Yuen Lau in Lens Actuator Inspection

Introduction

Chi Yuen Lau is an accomplished inventor based in Shenzhen, China. He has made significant contributions to the field of lens actuator inspection technology. His innovative approach has led to the development of a unique device that enhances the quality control processes in mass production.

Latest Patents

Chi Yuen Lau holds a patent for a "Device, system, and method for rapidly and comprehensively inspecting lens actuator." This invention includes a device designed for efficient inspection of lens actuators, featuring a bracket for fixing the actuator, a cone-shaped body with a mirror surface, and a camera positioned above the cone. The system allows for rapid and comprehensive inspections, covering various quality control parameters such as lens stroke and inclination under different conditions.

Career Highlights

Throughout his career, Chi Yuen Lau has worked with notable companies, including Ap Photonics (Shenzhen) Limited and Ap Photonics Limited. His experience in these organizations has contributed to his expertise in optical technologies and quality inspection methods.

Collaborations

Chi Yuen Lau has collaborated with professionals such as Kam Chiu Lau and Chen Chao, who have contributed to his projects and innovations in the field.

Conclusion

Chi Yuen Lau's contributions to lens actuator inspection technology demonstrate his commitment to innovation and quality control in manufacturing processes. His patent reflects a significant advancement in the industry, showcasing his expertise and dedication to improving inspection methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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