Taipei, Taiwan

Chi-Jen Liao

This inventor holds 1 USPTO granted patent. Top assignee: Primax Electronics Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chi-Jen Liao. Retrieved from https://idiyas.com/inventor/chi-jen-liao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Chi-Jen Liao

Chi-Jen Liao is a notable inventor based in Taipei, Taiwan. He has made significant strides in the field of image analysis, showcasing his expertise through his innovative patent.

Latest Patents

Chi-Jen Liao holds a patent for a "Method for using an image analysis program to analyze a plurality of images having the same image blocks." This invention relates to an image analysis method that allows for the analysis of images by inputting starting point coordinates and ending point coordinates of individual image blocks contained in the image. By creating an image block arrangement table, the image can be analyzed according to this table, enhancing the efficiency and accuracy of image processing.

Career Highlights

Chi-Jen Liao is currently employed at Primax Electronics Ltd., where he continues to contribute to advancements in technology. His work focuses on developing innovative solutions that leverage image analysis techniques to improve various applications.

Collaborations

Chi-Jen Liao has collaborated with his coworker, Tung-Hsuan Pai, to further enhance the capabilities of their projects. Their teamwork exemplifies the importance of collaboration in driving innovation and achieving successful outcomes.

Conclusion

In summary, Chi-Jen Liao is a talented inventor whose work in image analysis has led to valuable advancements in the field. His patent demonstrates his commitment to innovation and his contributions to technology will continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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