Zhubei, Taiwan

Chi-Hsien Lo

This inventor holds 1 USPTO granted patent. Top assignee: Mstar Semiconductor, Inc.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chi-Hsien Lo. Retrieved from https://idiyas.com/inventor/chi-hsien-lo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Chi-Hsien Lo

Introduction

Chi-Hsien Lo is a notable inventor based in Zhubei, Taiwan. He has made significant contributions to the field of display technology. His work focuses on enhancing the calibration processes for display devices, which is crucial for achieving optimal image quality.

Latest Patents

Chi-Hsien Lo holds a patent for a "Calibration system and calibration method for display device." This innovative calibration system includes an image signal source, a user-motion sensing module, a control module, and a calibration interface. The system allows users to adjust image characteristic parameters of the display device by detecting user motions and providing a corresponding interface for calibration.

Career Highlights

Chi-Hsien Lo is currently employed at Mstar Semiconductor, Inc., where he continues to develop cutting-edge technologies in display calibration. His expertise in this area has positioned him as a valuable asset to his company and the industry.

Collaborations

Chi-Hsien Lo has worked alongside his coworker, Chih-Chiang Chiu, contributing to advancements in display technology. Their collaboration has fostered innovation and improved the functionality of calibration systems.

Conclusion

Chi-Hsien Lo's contributions to display technology through his innovative patent demonstrate his commitment to enhancing user experience. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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