Mckinney, TX, United States of America

Cheryl Reid

This inventor holds 1 USPTO granted patent. Top assignee: Raytheon Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cheryl Reid. Retrieved from https://idiyas.com/inventor/cheryl-reid

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Cheryl Reid - Innovator in Electronic Device Tracking

Introduction

Cheryl Reid is a notable inventor based in McKinney, TX (US). She has made significant contributions to the field of electronic device tracking and verification. Her innovative work focuses on systems, devices, and methods for ensuring the authenticity of devices and bio-organisms.

Latest Patents

Cheryl Reid holds 1 patent for her invention titled "Electronic device tracking or verification." This patent outlines a method that includes identifying respective challenges indicating stimuli, generating these stimuli, and recording responses to the electrical stimuli. The process involves hashing the responses to create a key, which is then compared to a root node hash value to verify authenticity.

Career Highlights

Cheryl is currently employed at Raytheon Company, where she applies her expertise in electronic systems. Her work at Raytheon has allowed her to contribute to advanced technologies that enhance device security and verification processes.

Collaborations

Cheryl collaborates with her coworker, Nick Angelo, to further develop innovative solutions in their field. Their teamwork exemplifies the importance of collaboration in driving technological advancements.

Conclusion

Cheryl Reid's contributions to electronic device tracking and verification highlight her role as an influential inventor. Her innovative patent and work at Raytheon Company demonstrate her commitment to enhancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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