Milpitas, CA, United States of America

Chengqing Wang

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chengqing Wang. Retrieved from https://idiyas.com/inventor/chengqing-wang-ub6wleob

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Chengqing Wang: Innovator in Spectroscopic Measurements

Introduction

Chengqing Wang is a notable inventor based in Milpitas, CA. He has made significant contributions to the field of temperature monitoring through his innovative patent. His work focuses on utilizing spectroscopic measurements to enhance the accuracy of substrate temperature monitoring.

Latest Patents

Chengqing Wang holds a patent titled "Using Spectroscopic Measurements for Substrate Temperature Monitoring." This patent describes systems, methods, and computer-readable mediums for monitoring the temperature of a substrate. The invention involves performing spectroscopic measurements on the surface of the substrate using a metrology tool integrated with a processing tool. These measurements are crucial for determining when the substrate has cooled below a specified threshold temperature.

Career Highlights

Chengqing Wang is currently employed at Applied Materials, Inc., a leading company in the semiconductor and display industries. His work at Applied Materials has allowed him to develop and refine his innovative approaches to temperature monitoring.

Collaborations

Chengqing has collaborated with talented coworkers, including Ian McDonald and Prashant Aji, who contribute to the innovative environment at Applied Materials.

Conclusion

Chengqing Wang's contributions to the field of spectroscopic measurements and temperature monitoring exemplify the impact of innovation in technology. His patent reflects a commitment to advancing methods that enhance precision in substrate temperature management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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