Tokyo, Japan

Cheng Lei


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2020

Loading Chart...
1 patent (USPTO):Explore Patents

Title: **Cheng Lei: Innovator in Imaging Technology**

Introduction

Cheng Lei, a prominent inventor based in Tokyo, Japan, has made significant strides in the field of imaging technology. With one patented innovation to his name, he is committed to advancing the capabilities of inspection systems. His work exemplifies the intersection of technology and practical application, providing valuable contributions to research and industry alike.

Latest Patents

Cheng Lei holds a patent titled “Systems and methods for generating an image of an inspection object using an attenuated beam.” This innovative patent outlines a method in which a probe beam undergoes dispersive Fourier transformation. The approach involves spatially mapping the probe beam, irradiating the inspection object, and detecting the transmitted light to generate an image based on the light's intensity. This technology boasts the ability to generate high-quality images using a weak probe beam, ultimately improving throughput while minimizing the impact on the inspection object.

Career Highlights

Cheng Lei is associated with the University of Tokyo, where he contributes to research and development in imaging technologies. His academic background and professional experience have equipped him with the knowledge necessary to innovate and create impactful technologies, particularly in the area of optical systems.

Collaborations

Cheng works alongside esteemed colleagues, including Keisuke Goda, further enhancing the collaborative environment at the University of Tokyo. Their teamwork fosters an atmosphere of shared knowledge and expertise, driving forward their collective research goals in the field of imaging and inspection.

Conclusion

In summary, Cheng Lei's contributions to the field of imaging technology exemplify innovative thinking and practical application. His patented system provides a glimpse into the future of inspection methodology, where efficiency and effectiveness are paramount. As he continues to collaborate with fellow researchers, the potential for new advancements remains boundless.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…