The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
Oct. 14, 2016
The University of Tokyo, Tokyo, JP;
Keisuke Goda, Tokyo, JP;
Cheng Lei, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
According to the present invention, a probe beam () having undergone dispersive Fourier transformation by a dispersive Fourier transformation unit is spatially mapped, an inspection object () is irradiated with the probe beam (), and transmitted light () from the inspection object () is detected, whereby an image is generated on the basis of the intensity of the transmitted light (). Accordingly, an imaging apparatus can be provided which can irradiate the inspection object () with the weak probe beam () having an intensity attenuated by the dispersive Fourier transformation unit, which can generate an image only by detecting the transmitted light () from the inspection object (), and which has a high throughput of generating images while an influence on the inspection object () is suppressed.