Taipei, Taiwan

Cheng-Hsun Ho

This inventor holds 1 USPTO granted patent. Top assignee: Inventec Corp.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cheng-Hsun Ho. Retrieved from https://idiyas.com/inventor/cheng-hsun-ho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Cheng-Hsun Ho and Database-Aided Circuit Design

Introduction

Cheng-Hsun Ho is an inventor based in Taipei, Taiwan, whose work includes a patent for an artificial-intelligence-assisted circuit design system. His invention focuses on identifying design problems early and using production data to help diagnose and correct issues.

Latest Patents

Ho is associated with 1 patent: “Database-Aided Circuit Design System and Method Therefor.” The system uses an artificial intelligence simulation database containing criteria for optimized circuits. During early design, it can help detect potential product problems. After production, it can use stored records to identify factors that may have caused failures and support corrective action. The stated goals include reducing design and development costs, shortening time to market, and improving product competitiveness.

Career Highlights

Ho is associated with Inventec Corp. His patent describes a process that connects circuit simulation and early-stage error detection with diagnosis based on information gathered after a product is made.

Collaborations

The provided information lists Po-cheng Chiu and Chin-Tien Tseng as Ho’s coworkers. It does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Cheng-Hsun Ho’s patent presents a database-aided approach to circuit design that aims to detect problems earlier and use production experience to guide diagnosis and correction.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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