Bayan Lepas, Malaysia

Chee Lam Ng

This inventor holds 1 USPTO granted patent. Top assignee: Altera Corporation. Active years: 2018.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovations of Chee Lam Ng

Introduction

Chee Lam Ng is a notable inventor based in Bayan Lepas, Malaysia. He has made significant contributions to the field of electronics, particularly in the testing of analog-to-digital converters. His innovative approach has led to the development of a patented method that enhances the efficiency and accuracy of ADC testing.

Latest Patents

Chee Lam Ng holds a patent for a "Method and apparatus for using programmable logic circuitry to test on-chip analog-to-digital converter." This invention discloses a method of testing an analog-to-digital converter (ADC). The method includes receiving a series of analog signals from a tester site, converting the series of analog signals to a series of digital code words using an ADC, evaluating the ADC based on the series of digital code words using an ADC test setup, and generating an output signal identifying whether the ADC has passed the testing. This patent showcases his expertise and innovative thinking in the field.

Career Highlights

Chee Lam Ng is currently employed at Altera Corporation, where he continues to work on advancements in electronic testing technologies. His role at the company allows him to collaborate with other talented professionals in the industry.

Collaborations

Some of his notable coworkers include Chiew Khiang Kuit and Tze Sin Tan. Their collective efforts contribute to the innovative environment at Altera Corporation.

Conclusion

Chee Lam Ng's contributions to the field of electronics, particularly through his patented method for testing analog-to-digital converters, highlight his role as a significant inventor. His work continues to influence advancements in technology and improve testing methodologies.

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