Orpington, United Kingdom

Che Wan Chan

This inventor holds 1 USPTO granted patent. Top assignee: Imperial College of Science, Technology and Medicine. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Che Wan Chan. Retrieved from https://idiyas.com/inventor/che-wan-chan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Che Wan Chan: Innovator in Pipe Inspection Technology

Introduction

Che Wan Chan is a notable inventor based in Orpington, GB. He has made significant contributions to the field of pipe inspection technology. With a focus on innovation, he has developed solutions that enhance the efficiency and effectiveness of pipe inspections.

Latest Patents

Che Wan Chan holds a patent for the inspection of pipes. This invention showcases his commitment to improving industrial processes and ensuring safety in various applications. His patent is a testament to his innovative spirit and technical expertise.

Career Highlights

Chan is affiliated with the Imperial College of Science, Technology and Medicine. His work at this prestigious institution has allowed him to collaborate with leading experts in the field. His career is marked by a dedication to research and development in engineering and technology.

Collaborations

Some of his notable coworkers include Peter Cawley and David Nathaniel Alleyne. Together, they have contributed to advancements in their respective fields, fostering a collaborative environment that encourages innovation.

Conclusion

Che Wan Chan is a distinguished inventor whose work in pipe inspection technology exemplifies the impact of innovation in engineering. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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