This inventor holds 1 USPTO granted patent and 6 published patent applications. Top assignee: Amazing Microelectronic Corporation. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Che-hao Chuang: Innovator in Diode Testing Technology
Introduction
Che-hao Chuang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in diode testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of diode testing processes.
Latest Patents
Che-hao Chuang holds a patent for a "Diode test module for monitoring leakage current and its method thereof." This invention provides a diode test module and method that allows for effective monitoring of leakage current. The design includes a substrate with a first conductivity type and an epitaxial layer with a second conductivity type. A well region is formed in the epitaxial layer, along with heavily doped regions connected to input/output terminals. The invention notably allows for the determination of whether the well region is missing by measuring leakage current without the need for additional testing equipment.
Career Highlights
Che-hao Chuang is associated with Amazing Microelectronic Corporation, where he has been instrumental in advancing semiconductor technologies. His work has not only contributed to the company's success but has also positioned him as a key figure in the industry.
Collaborations
Throughout his career, Che-hao has collaborated with talented individuals such as Chih-Ting Yeh and Sung Chih Huang. These collaborations have fostered innovation and have led to the development of cutting-edge technologies in the field.
Conclusion
Che-hao Chuang's contributions to diode testing technology exemplify his innovative spirit and dedication to advancing semiconductor technology. His patent reflects a significant step forward in the efficiency of diode testing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile