Company Filing History:
Years Active: 2013
Title: Che-Chun Ou Yang: Innovator in Memory Chip Testing Technology
Introduction
Che-Chun Ou Yang is a notable inventor based in Taoyuan County, Taiwan. He has made significant contributions to the field of memory chip technology. His innovative approach has led to the development of a unique method for generating test patterns for memory chips.
Latest Patents
Che-Chun Ou Yang holds a patent titled "Device for generating a test pattern of a memory chip and method thereof." This patent describes a method that includes generating and outputting a pattern enabling signal based on first and second pattern signals. It also involves executing an exclusive-OR logic operation to produce a first enabling signal, which is crucial for writing predetermined logic voltages to each memory cell of the memory chip.
Career Highlights
He is currently employed at Etron Technology, Inc., where he continues to advance his research and development efforts in memory technology. His work has been instrumental in enhancing the efficiency and reliability of memory chips.
Collaborations
Che-Chun Ou Yang has collaborated with notable colleagues such as Shih-Hsing Wang and Chun-Ching Hsia. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Che-Chun Ou Yang's innovative contributions to memory chip technology exemplify the impact of dedicated inventors in the tech industry. His patent and ongoing work at Etron Technology, Inc. highlight the importance of innovation in advancing technology.