Location History:
- Sioux Falls, SD (US) (2004)
- Rockland, DE (US) (2003 - 2011)
Company Filing History:
Years Active: 2003-2011
Title: The Innovations of Charles William Robertson
Introduction
Charles William Robertson is a notable inventor based in Rockland, Delaware, with a remarkable portfolio of five patents. His work primarily focuses on advancements in optical measurements and fluorescence detection, showcasing his expertise in the field of nanotechnology.
Latest Patents
Robertson's latest patents include an "Instrument for making optical measurements on multiple samples retained by surface tension." This invention allows for multi-channel spectroscopic measurements on a variety of nanodrop samples held by surface tension between opposing optical fibers. A single fiber is scanned across a linear spaced array of receiving and detecting fibers, enhancing measurement efficiency.
Another significant patent is the "Apparatus and method for measuring the signal from a fluorescing nanodrop contained by surface tension." This apparatus describes a method for measuring the fluorescence of nanodrop liquid samples, where the sample is held by surface tension between two anvil surfaces. Each surface contains an embedded optical fiber, ensuring precise measurements while minimizing the impact of exciting and ambient light. The method is capable of detecting 1 femptomole of sodium fluorescein in just 1 microliter of TE buffer.
Career Highlights
Throughout his career, Robertson has contributed significantly to the field of optical measurement technologies. His innovative approaches have led to advancements that benefit various scientific and industrial applications.
Collaborations
Robertson has collaborated with notable individuals such as Joel Bruce Hansen and Thomas A. Tokash, further enhancing the impact of his inventions.
Conclusion
Charles William Robertson's contributions to optical measurement technologies and fluorescence detection demonstrate his innovative spirit and dedication to advancing scientific research. His patents reflect a commitment to improving measurement techniques, making significant strides in the field of nanotechnology.