The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Mar. 15, 2007
Applicants:
Charles William Robertson, Rockland, DE (US);
Thomas A. Tokash, Chesapeake City, MD (US);
Paul S. Zdinak, Kennett Square, PA (US);
Inventors:
Charles William Robertson, Rockland, DE (US);
Thomas A. Tokash, Chesapeake City, MD (US);
Paul S. Zdinak, Kennett Square, PA (US);
Assignee:
Nanodrop Technologies LLC, Wilmington, DE (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention is an installment for making multi-channel spectroscopic measurements on a plurality of nanodrop samples held by surface tension between opposing optical fibers wherein a single fiber is scanned across a linear spaced array of receiving, detecting fibers.
Robertson, Charles. (2011). Instrument for making optical measurements on multiple samples retained by surface tension (U.S. Patent No. 7872749). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7872749
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile