Dallas, TX, United States of America

Charles Harris


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Charles Harris

Introduction

Charles Harris is an accomplished inventor based in Dallas, TX. He has made significant contributions to the field of optical inspection, particularly in the semiconductor industry. His innovative approach has led to the development of a unique system and method for inspecting surface structures on various objects.

Latest Patents

Harris holds a patent for a "System and method of optically inspecting surface structures on an object." This invention focuses on the optical inspection of structures on the surface of objects, such as semiconductor wafers. The system utilizes a platform to support the object under examination, equipped with lights or other energy sources for optimal illumination. By orienting two opposing lateral energy sources to direct energy along the surface at a low angle, and using a coaxial light source, Harris's method captures high-quality images of the surface. The energy reflected back is recorded by a device like a CCD camera, and the lighting can be controlled by an attached computer for image processing and defect analysis.

Career Highlights

Harris's career is marked by his dedication to advancing optical inspection technologies. His work has not only improved the efficiency of inspections but has also enhanced the accuracy of defect detection in semiconductor manufacturing. His innovative solutions have made a lasting impact on the industry.

Collaborations

Throughout his career, Harris has collaborated with talented individuals such as Youling Lin and Max Guest. These partnerships have fostered a creative environment that has led to further advancements in optical inspection technologies.

Conclusion

Charles Harris is a notable inventor whose contributions to optical inspection have significantly influenced the semiconductor industry. His innovative patent demonstrates his commitment to improving inspection methods and ensuring the quality of semiconductor products.

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