Liège, Belgium

Charles Hanquet

This inventor holds 1 USPTO granted patent. Top assignee: Arcelormittal. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Charles Hanquet. Retrieved from https://idiyas.com/inventor/charles-hanquet-6t4qqi5f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Charles Hanquet and Coil-Coating Innovation

Introduction

Charles Hanquet is an inventor associated with Liège, Belgium, and ArcelorMittal. His patent work addresses the control of gloss in organic coatings applied to moving metal strips on coil-coating lines.

Latest Patents

Hanquet is associated with 1 patent: “Method for Managing Coating Gloss on a Coil-Coating Line.” The invention describes a method for controlling the gloss of an organic coating by setting a target gloss, an acceptable gloss range, and a proportionality constant for a predefined relationship between wet-film temperature and gloss. The process measures the wet-film temperature upstream of the UV-curing device and measures the coating’s gloss. When the measured gloss falls outside the specified range, the method calculates a corrected wet-film temperature intended to bring the gloss toward its target.

Career Highlights

Hanquet’s patent reflects an industrial focus on managing coating quality during continuous production. By linking gloss measurements to wet-film temperature before UV curing, the method provides a way to adjust process conditions on a coil-coating line.

Collaborations

The information provided names Fabrice Farina and Jacky Mallegol as Hanquet’s coworkers. The patent is associated with ArcelorMittal.

Conclusion

Charles Hanquet’s patent work focuses on a practical approach to controlling coating gloss through temperature management, contributing to process control in coil-coating production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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