Maitland, FL, United States of America

Charles E Stirman

This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Martin Corporation. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Charles E Stirman. Retrieved from https://idiyas.com/inventor/charles-e-stirman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 51(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Innovations of Charles E Stirman

Introduction

Charles E Stirman is an accomplished inventor based in Maitland, FL (US). He holds a patent that showcases his expertise in the field of automatic target recognition. His work has significant implications for technology used in radar systems.

Latest Patents

Stirman is credited with a patent titled "Apparatus for and method of classifying patterns." This invention involves an apparatus and method for classifying a pattern through the performance of a wavelet transform. The technology is particularly useful in automatic target recognition, where the pattern is derived from a return radar signal, aiding in the classification of targets.

Career Highlights

Charles E Stirman is associated with Lockheed Martin Corporation, a leading aerospace and defense company. His contributions to the field have been recognized for their innovative approach to pattern classification and target recognition.

Collaborations

Some of his notable coworkers include Richard D McCoy and James N O'Sullivan, who have also made significant contributions to their respective fields.

Conclusion

Charles E Stirman's work exemplifies the intersection of innovation and technology, particularly in the realm of automatic target recognition. His patent reflects a commitment to advancing methods that enhance the capabilities of radar systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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