Charles A Puntar

Title: The Innovations of Charles A Puntar

Introduction

Charles A Puntar is a notable inventor based in Hopewell Junction, NY (US). He has made significant contributions to the field of integrated circuit testing and high-speed digital counting. With a total of 3 patents to his name, Puntar's work has had a considerable impact on technology.

Latest Patents

One of Puntar's latest patents is titled "Per-pin integrated circuit test system having n-bit interface - Apparatus and method for controlling an operation of a test pin of a per-pin semiconductor device test system." This invention includes a pattern storage memory for storing and outputting information related to the state of the test pin for individual test cycles. It features a pattern processor that generates words comprised of M bits for each test cycle, and a test pin control memory that decodes these words into command words. The system also includes test pin signal receiving circuitry for receiving electrical signals from the test pin.

Another significant patent is the "High speed digital counter." This invention is a high-speed counter circuit designed for counting electrical pulses. It utilizes a master/slave flip-flop at the input stage and an AND gate to produce a gating signal. The counter comprises cascade coupled flip-flops, with the clock input generated by the logical OR of the counted pulses and other signals. The output is provided by the inverse slave output of each flip-flop.

Career Highlights

Charles A Puntar is currently employed at International Business Machines Corporation (IBM), where he continues to innovate and develop new technologies. His work at IBM has allowed him to explore various aspects of integrated circuit testing and digital counting.

Collaborations

Throughout his career, Puntar has collaborated with notable colleagues, including Dale E Hoffman and Algirdas J Gruodis. These collaborations have contributed to the advancement of technology in their respective fields.

Conclusion

Charles A Puntar is a distinguished inventor whose contributions to integrated circuit testing and high-speed digital counting have made a lasting impact on technology. His innovative patents and work at IBM highlight his dedication to advancing the field.