Taichung City, Taiwan

Chao-Hung Nien

This inventor holds 1 USPTO granted patent. Top assignee: Nien Made Enterprise Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chao-Hung Nien. Retrieved from https://idiyas.com/inventor/chao-hung-nien-650cpth2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chao-Hung Nien and Window-Covering Cutting Innovation.

Introduction

Chao-Hung Nien is an inventor associated with Taichung City, Taiwan, and Nien Made Enterprise Co., Ltd. His patent work includes a method designed to improve the accuracy of cutting window coverings.

Latest Patents

Nien is named on 1 patent: “Method of Cutting Window Covering.” The method uses a cutting apparatus to receive the window covering’s mounting mode, cutting dimensions, and identification information. A position detector measures the limit assembly, while a signal-processing circuit calculates adjusted and target positions. The operator moves the limit assembly until the positions match, after which the cutting device cuts the covering against the limit. By calculating the correct cutting position, the method aims to reduce sizing errors caused by user miscalculation.

Career Highlights

Nien’s patent reflects a practical approach to improving precision in window-covering production. The invention combines position detection, signal processing, and manual adjustment to guide the cutting process.

Collaborations

Nien’s listed coworkers include Wei-Chieh Tang and Shun-Yuan Ke. His work is associated with Nien Made Enterprise Co., Ltd.

Conclusion

Chao-Hung Nien’s patented method applies calculated positioning and detection to help make window-covering cuts more accurate and consistent.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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