Shenzhen, China

Changqing Wei

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Shenzhen Ktc Commercial Display Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Changqing Wei. Retrieved from https://idiyas.com/inventor/changqing-wei-nx56223v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Changqing Wei: Inventor of an Infrared Touch Frame with Radio Frequency Signal Processing

Introduction

Changqing Wei is an inventor based in Shenzhen, China. His listed patent concerns an electronic device and infrared touch frame designed to support radio frequency signal processing.

Latest Patents

Wei is associated with 1 patent: “Electronic Device and Infrared Touch Frame Having Radio Frequency Signal Processing Function.” The invention describes an accommodation space in an infrared touch frame containing a circuit board, an infrared light element, and a radio frequency signal element. The circuit board connects electrically to both signal elements. A filter strip on the side of the frame facing the display device allows infrared and radio frequency signals to pass through, with the stated aim of improving radio frequency signal transmission efficiency.

Career Highlights

Wei is associated with Shenzhen KTC Commercial Display Technology Co., Ltd. The available information identifies his work through the patent and does not provide further details about his role or career history.

Collaborations

Xudong Li and Zhenle Li are identified as Wei’s coworkers. The provided information does not specify their roles in the patent or describe particular collaborations.

Conclusion

Changqing Wei’s listed invention combines infrared touch-frame components with radio frequency signal processing, focusing on signal transmission through a filter strip.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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