Gimhae, South Korea

Chang Uk Shin

This inventor holds 1 USPTO granted patent. Top assignee: Changwon National University Industry University Cooperation Foundation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chang Uk Shin. Retrieved from https://idiyas.com/inventor/chang-uk-shin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Chang Uk Shin: Inventor in Natural Language Processing

Introduction

Chang Uk Shin is an inventor based in Gimhae, South Korea. His patent work addresses the quality of language data used to develop natural language processing systems.

Latest Patents

Shin is associated with 1 patent: “Device for Automatically Detecting Morpheme Part of Speech Tagging Corpus Error by Using Rough Sets, and Method Therefor.” The invention describes a device that applies rough set theory to generate attributes for word phrases in an input corpus. It then counts and analyzes attributes associated with repeated word phrases to identify and quantify part-of-speech tagging errors. The approach is intended to help detect and correct errors in training data used for classifier development and natural language recognition.

Career Highlights

Shin is associated with the Changwon National University Industry University Cooperation Foundation. His patent reflects an applied research focus on improving the reliability of linguistic corpora used in computational language technologies.

Collaborations

The provided information lists Tae Ho Park and Da Sol Park as Shin’s coworkers. Their names are associated with his professional context, though specific collaborative roles are not stated.

Conclusion

Chang Uk Shin’s patent focuses on using rough set-based analysis to identify and address morpheme-tagging errors, supporting more reliable data for natural language processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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