Yongin-si, South Korea

Chang Soo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chang Soo Lee. Retrieved from https://idiyas.com/inventor/chang-soo-lee-6e1bcz3e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chang Soo Lee and Display Technology

Introduction

Chang Soo Lee is an inventor based in Yongin-si, South Korea. His listed patent concerns display-device design and a method for driving the device. The available information identifies Samsung Display Co., Ltd. as his company and lists one patent.

Latest Patents

Lee’s listed patent is “Display Device and Method of Driving the Same.” It describes a display device with scan and data drivers, sensing lines, and pixels containing a light-emitting element and associated transistors. The sensor is configured to detect deterioration information about the light-emitting element while the switching and sensing transistors are turned on. The patent record provided does not establish when this patent was filed or granted.

Career Highlights

The information provided associates Lee with Samsung Display Co., Ltd., a company working in display technology. His listed patent addresses sensing deterioration in a light-emitting display element, a capability relevant to monitoring display performance. The supplied record lists 1 patent for him.

Collaborations

Jong Hee Kim is identified as Lee’s coworker. The information provided does not specify whether Kim collaborated with Lee on the listed patent.

Conclusion

Chang Soo Lee’s listed patent focuses on a display device that can sense deterioration in its light-emitting element, reflecting an invention directed toward display monitoring and operation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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