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For the Inventor, By the Inventor

Hsinchu, Taiwan

Chang-Lin Wei

This inventor holds 16 USPTO granted patents and 2 published patent applications and 1 EPO patent, primarily in Inductor Devices. Top assignees: Industrial Technology Research Institute, Mediatek Corporation. Active years: 2008-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chang-Lin Wei. Retrieved from https://idiyas.com/inventor/chang-lin-wei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 16 

% Patents Active = 43.8

 

Average Co-Inventor Count = 5.0

ph-index = 4

Forward Citations = 163(Granted Patents)


Location History:

  • Miaoli County, TW (2008 - 2011)
  • Miao-Li, TW (2011)
  • Hsinchu, TW (2010 - 2024)

Company Filing History:

goldMedal13 out of 9,323 
 
Industrial Technology Research Institute
 patents
silverMedal3 out of 5,164 
 
Mediatek Corporation
 patents

Years Active: 2008-2025

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Areas of Expertise:
Inductor Devices
Capacitor Structure
High-Frequency Switch
Embedded Resistor
Tunable Inductor
Circuit Boards
Resistor Layout
Multi-Layer Substrate
Transformer
Test Kit
16 patents (USPTO):Explore Patents
1. 12352781 - Test kit for testing a device under test (2025-07-08),
2. 11879934 - Test kit for testing a device under test (2024-01-23),
3. 11624758 - Test kit for testing a device under test (2023-04-11),
4. 8441332 - Inter-helix inductor devices (2013-05-14),
5. 8274352 - Inductor devices (2012-09-25),
6. 8077443 - Capacitor structure with raised resonance frequency (2011-12-13),
7. 7994885 - High-frequency switch in multi-layer substrate (2011-08-09),
8. 7948355 - Embedded resistor devices (2011-05-24),
9. 7940157 - Resistor layout structure and manufacturing method thereof (2011-05-10),
10. 7936243 - Adjustable resistor embedded in multi-layered substrate and method for forming the same (2011-05-03),
11. 7932802 - Meander inductor and substrate structure with the same (2011-04-26),
12. 7911318 - Circuit boards with embedded resistors (2011-03-22),
13. 7884697 - Tunable embedded inductor devices (2011-02-08),
14. 7868727 - Inter-helix inductor devices (2011-01-11),
15. 7796006 - Suspension inductor devices (2010-09-14),

Title: Chang-Lin Wei: Innovator in Testing Technologies

Introduction

Chang-Lin Wei is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of testing technologies, holding a total of 16 patents. His work focuses on developing innovative solutions for testing devices, which are crucial in various technological applications.

Latest Patents

Among his latest inventions is a test kit designed for testing a device under test (DUT). This test kit features a socket structure that securely contains the DUT, along with a plunger assembly that is detachably coupled to the socket structure. The plunger assembly is characterized by a multi-layered structure that includes a nest and an interposer substrate installed beneath the nest. This innovative design enhances the efficiency and accuracy of testing procedures.

Career Highlights

Chang-Lin Wei has had a distinguished career, working with notable organizations such as the Industrial Technology Research Institute and MediaTek Corporation. His experience in these institutions has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Throughout his career, Chang-Lin Wei has collaborated with esteemed colleagues, including Chang-Sheng Chen and Chin-Sun Shyu. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Chang-Lin Wei's contributions to testing technologies exemplify his dedication to innovation. His patents and collaborations reflect a commitment to advancing the field, making him a notable figure in the realm of invention.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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