This inventor holds 1 USPTO granted patent. Top assignee: Chroma Ate Inc.. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Chang-Jyun He: Innovator in Temperature Control Systems
Introduction
Chang-Jyun He is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of temperature control systems, particularly in the context of devices under test and image sensor-testing apparatuses. His innovative approach has led to the development of a patented technology that enhances the efficiency and accuracy of temperature regulation in testing environments.
Latest Patents
Chang-Jyun He holds a patent for a "Temperature control and method for devices under test and image sensor-testing apparatus having the system." This patent describes a comprehensive temperature control method that involves regulating the temperatures of multiple devices under test (DUTs) within a designated temperature control zone. The process includes transferring these devices to a test plate, placing them into specific test slots, and utilizing temperature-sensing elements to monitor their temperatures. If any DUT fails to meet the required temperature, a corresponding temperature control element adjusts the temperature accordingly.
Career Highlights
Chang-Jyun He is currently employed at Chroma Ate Inc., a company known for its advanced testing and measurement solutions. His work at Chroma Ate Inc. has allowed him to apply his expertise in temperature control systems to real-world applications, contributing to the company's reputation for innovation and quality.
Collaborations
Throughout his career, Chang-Jyun He has collaborated with talented individuals such as Yung-Fan Chu and Chin-Yi Ouyang. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.
Conclusion
Chang-Jyun He is a distinguished inventor whose work in temperature control systems has made a significant impact in the field of testing and measurement. His patented technology exemplifies innovation and addresses critical challenges in device testing. His contributions continue to influence the industry and inspire future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
