Chang-Jung Wen

Title: **Chang-Jung Wen: Innovator in Surface-Enhanced Raman Scattering Detection**

Introduction

Chang-Jung Wen, an inventor based in Hsinchu, Taiwan, is recognized for his innovative work in the field of chemical detection. With a focus on enhancing the accuracy and efficiency of pesticide residue detection, Wen has successfully developed a unique method that leverages surface-enhanced Raman scattering (SERS) technology.

Latest Patents

Chang-Jung Wen holds one patent titled "Surface-enhanced Raman scattering detection method for rapid detection of pesticide residues." This invention outlines a sophisticated detection method for identifying target analytes within samples. The process involves several crucial steps: preparing a sample extract, utilizing a SERS substrate to absorb the target analyte, and employing a volatile organic solvent to facilitate the detection process. The method culminates in a detailed Raman measurement, allowing for precise analysis of pesticide residues.

Career Highlights

Currently, Chang-Jung Wen is affiliated with Phansco Co., Ltd., where he contributes his expertise in innovative detection methods. His work stands out in the research community, illustrating his commitment to advancing technology in chemical detection and safety.

Collaborations

Chang-Jung Wen collaborates with notable colleagues, including Chao-Ming Tsen and Ching-Wei Yu. Together, they bring diverse skills and knowledge to their projects, enhancing the inventive process and driving further advancements in their respective fields.

Conclusion

Chang-Jung Wen's contributions to the field of pesticide detection represent a significant stride in ensuring food safety and environmental protection. His patent not only underscores his inventive capabilities but also highlights the ongoing need for innovative solutions in chemical detection methodologies. As technologies evolve, Wen's work continues to inspire the pursuit of excellence in science and innovation.