The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Jul. 20, 2017
Phansco Co., Ltd., Hsinchu, TW;
Chao-Ming Tsen, Kaohsiung, TW;
Ching-Wei Yu, Taipei, TW;
Wei-Chung Chao, Hsinchu, TW;
Yung-Hsiang Wang, New Taipei, TW;
Cheng-Chien Li, Hsinchu, TW;
Shao-Kai Lin, Taichung, TW;
Tzu-Hung Hsu, Taichung, TW;
Chang-Jung Wen, Hsinchu, TW;
PHANSCO CO., LTD., Hsinchu, TW;
Abstract
A surface-enhanced Raman scattering (SERS) detection method is provided for detecting a target analyte in a sample. The SERS detection method generally includes the steps of: (a). preparing an extract of the sample; (b). introducing the sample extract onto a SERS substrate, causing the target analyte to be absorbed in the SERS substrate; (c). introducing a volatile organic solvent onto the SERS substrate to have the target analyte of the sample extract dissolved and comes out of the SERS substrate; (d). irradiating the SERS substrate with light to evaporate the volatile organic solvent, leaving a more condensed target analyte on the SERS substrate; (e). irradiating the condensed target analyte with laser light to have the target analyte penetrate deeply into the SERS substrate; and (f). performing Raman measurement with a laser beam focusing on the SERS substrate to analyze the target analyte.