Company Filing History:
Years Active: 2011
Title: **Chang-Hai Sung: Innovator in Scatterfield Microscopical Measurement**
Introduction
Chang-Hai Sung is a notable inventor based in Hsinchu County, Taiwan, known for his groundbreaking contributions to the field of microscopical measurement. His innovative approach combines advanced technology and intricate methodologies, paving the way for enhanced precision in measurements beyond traditional optical limits.
Latest Patents
Chang-Hai Sung holds a patent for a revolutionary method and apparatus for scatterfield microscopical measurement. This invention integrates a scatterometer with a bright-field microscope, enabling measurement precision that surpasses the optical diffraction limit. The detection beam is generated through a process that utilizes either a Liquid Crystal on Silicon (LCoS) or a Digital Micro-Mirror Device (DMD). This beam is directed to the back focal plane of the object under examination, allowing for the collection of scattered beams, which are then focused to form an optical signal detected by an array-type detection device. The method permits the detection beam to be modulated at various angles, facilitating the collection of zero and higher order diffraction intensities from different incident angles, significantly enhancing measurement capabilities.
Career Highlights
Chang-Hai Sung is affiliated with the Industrial Technology Research Institute, a prominent organization dedicated to advancing industrial technology. His contributions are vital to the institute's efforts to enhance microscopical measurement techniques, providing high-value innovations that impact various applications in research and industry.
Collaborations
Throughout his career, Chang-Hai has collaborated with esteemed colleagues, including Sen-Yih Chou and Shu-Ping Dong. These collaborations reflect a strong commitment to teamwork in the pursuit of innovative solutions and advancements in technology.
Conclusion
The work of Chang-Hai Sung exemplifies the vital role of inventors in driving technological progress. His patent for the method and apparatus for scatterfield microscopical measurement showcases his dedication to pushing the boundaries of scientific measurement. As innovation continues to evolve, Chang-Hai's contributions will undoubtedly have a lasting impact on the fields of microscopy and measurement technology.