This inventor holds 1 USPTO granted patent. Top assignee: University System of Maryland. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011
Title: Innovations in Optical Microscopy by Chandran R Sabanayagam
Introduction
Chandran R Sabanayagam is an accomplished inventor based in Abingdon, MD (US). He has made significant contributions to the field of optical microscopy, particularly in the area of subwavelength resolution imaging. His innovative methods have the potential to advance the capabilities of imaging technologies.
Latest Patents
Chandran R Sabanayagam holds a patent for "Subwavelength resolution optical microscopy." This patent describes methods for imaging subwavelength structures in three dimensions with high resolution. The techniques involve illuminating subwavelength structures with a specific wavelength of light and detecting the self-image generated at a distance from the structures. Additionally, the patent outlines a method for confining propagating light to a dimension that is below the diffraction limit by using coherent light on a metal structure with subwavelength features.
Career Highlights
Chandran R Sabanayagam is affiliated with the University System of Maryland, where he continues to engage in research and development in optical technologies. His work has garnered attention for its innovative approach to microscopy, which could have far-reaching implications in various scientific fields.
Collaborations
Chandran has collaborated with notable colleagues such as Joseph R Lakowicz and Mustafa Habib Chowdhury. These partnerships have likely contributed to the advancement of his research and the development of new methodologies in optical microscopy.
Conclusion
Chandran R Sabanayagam's contributions to the field of optical microscopy exemplify the importance of innovation in scientific research. His patented methods for subwavelength resolution imaging represent a significant advancement in the ability to visualize structures at unprecedented levels of detail.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
