North York, Canada

Chandan M Roy

This inventor holds 1 USPTO granted patent. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chandan M Roy. Retrieved from https://idiyas.com/inventor/chandan-m-roy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations by Chandan M Roy in Automated Accident Analysis

Introduction

Chandan M Roy is an innovative inventor based in North York, Canada. He has made significant contributions to the field of automated accident analysis. His work focuses on enhancing safety and efficiency through advanced technological solutions.

Latest Patents

Chandan M Roy holds a patent for "Systems and methods for automated accident analysis." This patent encompasses various features such as automatic multi-device accident detection and verification, automated multi-device information capture, and automated geospatial and geo-relational digital scene recreation. His invention aims to streamline the process of accident analysis, making it more accurate and efficient.

Career Highlights

Throughout his career, Chandan has demonstrated a commitment to innovation and problem-solving. His patent reflects his dedication to improving safety measures and accident response protocols. With a focus on technology, he has positioned himself as a key player in the field of automated systems.

Collaborations

Chandan has collaborated with notable individuals in his field, including Shahbaz R Bhatti and Alan M O'Brien. These partnerships have contributed to the development and refinement of his innovative solutions.

Conclusion

Chandan M Roy's work in automated accident analysis showcases his inventive spirit and dedication to enhancing safety through technology. His contributions are paving the way for more effective accident management solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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