Incheon, South Korea

Chan-won Seo

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chan-won Seo. Retrieved from https://idiyas.com/inventor/chan-won-seo-7q93h1pp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Chan-won Seo in Tomography Technology

Introduction

Chan-won Seo is a notable inventor based in Incheon, South Korea. He has made significant contributions to the field of tomography, particularly through his innovative patent that enhances imaging techniques. His work is instrumental in advancing medical imaging technologies.

Latest Patents

Chan-won Seo holds a patent for a "Tomography apparatus and method of reconstructing cross-sectional image." This invention includes a data obtainer that captures first and second image data using X-ray irradiation. The apparatus features an image processor that performs noise reduction and generates reference images, which are then used by an image reconstructor to create a target image representing the object.

Career Highlights

Chan-won Seo is currently employed at Samsung Electronics Co., Ltd., where he continues to develop cutting-edge technologies. His expertise in imaging systems has positioned him as a key player in the field of medical technology.

Collaborations

He has collaborated with notable colleagues such as Toshihiro Rifu and Kyoung-Yong Lee, contributing to various projects that enhance imaging capabilities.

Conclusion

Chan-won Seo's innovative work in tomography exemplifies the impact of technology on medical imaging. His contributions are paving the way for advancements that improve diagnostic capabilities and patient care.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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