Seoul, South Korea

Chan-il Jeong

This inventor holds 1 USPTO granted patent. Top assignee: Afs Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chan-il Jeong. Retrieved from https://idiyas.com/inventor/chan-il-jeong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chan-il Jeong and Hair Self-Diagnosis Innovation.

Introduction

Chan-il Jeong is an inventor based in Seoul, South Korea, associated with Afs Inc. His work includes a patent for technology designed to improve the accuracy of hair self-diagnosis.

Latest Patents

Jeong’s patent, “Method for Executing Application Having Improved Self-Diagnosis Accuracy for Hair, and Self-Diagnosis Service Device for Hair by Using Same,” describes a system that derives virtual three-dimensional information from two-dimensional images of a user’s hairline. It identifies head depth and hairline features, recommends a hairline suited to the user’s hairline and facial shape, estimates hair density near the forehead, and calculates the approximate number of hairs needed for a selected hairline. The application is intended to make self-diagnosis more accurate and help users assess the potential need for hair transplantation. Jeong is credited with 1 patent.

Career Highlights

Jeong’s documented patent work focuses on applying image-based analysis to personalized hairline assessment. The invention combines hairline recommendations with estimates of hair density and required hair count.

Collaborations

Jeong’s listed coworkers include Taehee Kim and Hojong Lee. His company affiliation is Afs Inc.

Conclusion

Chan-il Jeong’s patent presents a technology-based approach to hair self-diagnosis, using image analysis to provide personalized hairline recommendations and estimates relevant to hair transplantation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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