Hong Kong, China

Cham Fung Lai

This inventor holds 2 USPTO granted patents. Top assignee: Hayco Manufacturing Limited. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cham Fung Lai. Retrieved from https://idiyas.com/inventor/cham-fung-lai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.5

ph-index = 2

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 2002

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2 patents (USPTO):Explore Patents

Title: The Innovative Journey of Cham Fung Lai

Introduction: Cham Fung Lai is a notable inventor based in Hong Kong, China, recognized for his contributions to tool design. With two patents under his name, Lai has made significant strides in enhancing the functionality of tools through innovative design.

Latest Patents: One of Lai's most recent inventions is a "Handle for Tool," which demonstrates his commitment to improving user experience and efficiency in tool usage. The design aims to provide better grip and comfort, reflecting the needs and preferences of users.

Career Highlights: Cham Fung Lai is currently employed at Hayco Manufacturing Limited, an innovative company specializing in manufacturing high-quality products. His role there has allowed him to explore new ideas and technologies, leading to the successful development of his patents.

Collaborations: Throughout his career, Lai has collaborated with talented coworkers including Wing Shun Vincent Luk and Donald Espie Hay. Their shared vision and expertise have contributed to the successful realization of innovative projects within their organization.

Conclusion: Cham Fung Lai exemplifies the spirit of innovation in the field of tool design. His patents and collaborations with colleagues at Hayco Manufacturing Limited highlight the importance of teamwork and creativity in driving technological advancement. As he continues to innovate, the impact of his work will surely be felt across various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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