Paderborn, Germany

Cedrik Munk

This inventor holds 1 USPTO granted patent. Top assignee: Dspace Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Cedrik Munk. Retrieved from https://idiyas.com/inventor/cedrik-munk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Cedrik Munk and His Patent for Electronic Control Unit Testing

Introduction

Cedrik Munk is an inventor associated with Paderborn, Germany, and DSPACE GmbH. His patent work includes a device designed to support testing electronic control units with a hardware-in-the-loop simulator.

Latest Patents

Munk is credited with 1 patent: “Device for Testing an Electronic Control Unit, Comprising a Hardware-in-the-Loop Simulator.” The invention uses a simulator to generate sensor signals and a two-wire cable to route those signals through a switchover device to an electronic control unit. The device also includes two voltage sources, each connected to a respective wire through a controllable switch. This arrangement can maintain electrical power to a sensor during diagnostics, helping to avoid diagnostic errors.

Career Highlights

Munk’s listed patent reflects work on testing systems that combine simulated sensor signals with practical diagnostic requirements. The design addresses how an electronic control unit can receive sensor signals while the sensor continues to receive electrical energy.

Collaborations

Munk is associated with DSPACE GmbH. His listed coworkers include Christian Dierkes and Andre Kethler.

Conclusion

Cedrik Munk’s patent describes a hardware-in-the-loop testing device that supports sensor-signal simulation while helping maintain sensor power during diagnostics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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