Valencia, Spain

Carlos Saez Silvestre

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Polytechnic University of Valencia. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Carlos Saez Silvestre. Retrieved from https://idiyas.com/inventor/carlos-saez-silvestre

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations by Carlos Saez Silvestre

Introduction

Carlos Saez Silvestre is an accomplished inventor based in Valencia, Spain. He has made significant contributions to the field of medical imaging through his innovative methods and systems. His work focuses on enhancing the generation of multiparametric nosological images, which are crucial for medical diagnostics.

Latest Patents

Carlos holds a patent for a "Method and system for generating multiparametric nosological images." This patent describes a comprehensive method that includes obtaining a stack of images, improving these images, and classifying them in an unsupervised manner. The process culminates in the generation of a nosological image that aids in medical analysis.

Career Highlights

Carlos is affiliated with the Polytechnic University of Valencia, where he contributes to research and development in medical imaging technologies. His expertise in image processing and classification has positioned him as a key figure in his field.

Collaborations

He has collaborated with notable colleagues, including Miguel Esparza Manzano and Elies Fuster Garcia, to advance research in multiparametric imaging techniques.

Conclusion

Carlos Saez Silvestre's innovative work in generating multiparametric nosological images represents a significant advancement in medical imaging technology. His contributions continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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