Royal Oak, MI, United States of America

Carl J Hildebrand, Jr

This inventor holds 1 USPTO granted patent. Top assignee: Technolines, LLC. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Carl J Hildebrand, Jr. Retrieved from https://idiyas.com/inventor/carl-j-hildebrand-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 66(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Carl J Hildebrand, Jr.

Introduction

Carl J Hildebrand, Jr. is an accomplished inventor based in Royal Oak, MI (US). He has made significant contributions to the field of material coding through his innovative use of laser technology. His work has paved the way for advancements in how codes are applied and detected on various articles, including clothing.

Latest Patents

Hildebrand holds a patent for a laser marking system that encodes a code on an article. This system allows the code to be detected by a camera or other imaging system that does not require reflectivity for its proper operation. This innovation enhances the efficiency and accuracy of material coding.

Career Highlights

Hildebrand is currently associated with Technolines, LLC, where he continues to develop and refine his inventions. His expertise in laser technology has positioned him as a key player in the industry, contributing to the advancement of coding systems.

Collaborations

Hildebrand works alongside his coworker, Darryl J Costin, who shares a commitment to innovation and excellence in their projects.

Conclusion

Carl J Hildebrand, Jr. exemplifies the spirit of innovation through his contributions to laser marking technology. His work not only enhances material coding but also sets a standard for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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