Suzhou, China

Can Deng

This inventor holds 1 USPTO granted patent. Top assignee: Suzhou Metabrain Intelligent Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Can Deng. Retrieved from https://idiyas.com/inventor/can-deng-1msgtljm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Can Deng: Data Storage Innovation in Suzhou

Introduction

Can Deng is an inventor based in Suzhou, China, associated with Suzhou Metabrain Intelligent Technology Co., Ltd. His patent work addresses data storage reliability, particularly how systems can handle a disk node experiencing a redundancy failure.

Latest Patents

Deng is associated with 1 patent: “Data Writing Method and System, Storage Hard Disk, Electronic Device and Storage Medium.” The invention describes checking the state of a main disk node designated to receive target data. If the node is in a redundancy failure state, the system writes the data to a backup disk node in a different fault domain. Once the main node returns to a normal state, the stored data is copied from the backup node to the main node. The approach is intended to support data availability during disk-node failures.

Career Highlights

Deng’s listed patent reflects work in data storage methods and systems. His disclosed approach combines node-state monitoring with backup storage across separate fault domains, followed by data synchronization when the main node recovers.

Collaborations

Deng is associated with Suzhou Metabrain Intelligent Technology Co., Ltd. His listed coworkers include Kai Zhang and Chao Jiang.

Conclusion

Can Deng’s patent focuses on maintaining access to target data during a disk-node redundancy failure and restoring it to the main node after recovery.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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