San Jose, CA, United States of America

Calvin K Choi


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Calvin K Choi: Innovator in Semiconductor Reliability Testing

Introduction

Calvin K Choi is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor technology, particularly in reliability testing methods for trench devices. His innovative approach addresses critical issues related to long-term reliability in semiconductor transistors.

Latest Patents

Calvin K Choi holds a patent for a "Reliability test method for semiconductor trench devices." This invention focuses on detecting defects near the gate/trench-surface interface of trench transistors. The method involves applying a negative voltage to the gate of the trench transistor while grounding the drain and floating the source. By measuring the leakage current between the gate and drain, the invention identifies defective transistors based on their gate-drain leakage current exceeding predetermined values. Additionally, the method monitors the leakage current over time to assess the reliability of the transistor.

Career Highlights

Calvin K Choi is currently employed at Siliconix Incorporation, where he continues to develop innovative solutions in semiconductor technology. His work has contributed to enhancing the reliability and performance of trench transistors, which are essential components in modern electronic devices.

Collaborations

Calvin has collaborated with esteemed colleagues, including Fwu-Iuan Hshieh and William H Cook. Their combined expertise has further advanced the research and development of semiconductor technologies.

Conclusion

Calvin K Choi's contributions to semiconductor reliability testing exemplify the importance of innovation in technology. His patent and ongoing work at Siliconix Incorporation highlight his commitment to improving the performance and reliability of electronic components.

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