Bothell, WA, United States of America

C Mark Nerby

This inventor holds 4 USPTO granted patents. Top assignees: Fluke Corporation, John Fluke Mfg. Co., Inc.. Active years: 1992-1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: C Mark Nerby. Retrieved from https://idiyas.com/inventor/c-mark-nerby

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 4

Forward Citations = 67(Granted Patents)


Company Filing History:


Years Active: 1992-1995

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4 patents (USPTO):Explore Patents

Title: C Mark Nerby: Innovator in Network Testing Technology

Introduction

C Mark Nerby is a notable inventor based in Bothell, WA (US), recognized for his contributions to network testing technology. With a total of 4 patents, he has made significant advancements in the field of local area network testing.

Latest Patents

Among his latest patents are the "Remote Unit for Local Area Network Cable Tester" and the "Local Area Network Cable Test Instrument." These innovations reflect his commitment to improving the efficiency and reliability of network testing processes.

Career Highlights

C Mark Nerby has had a distinguished career, working with reputable companies such as Fluke Corporation and John Fluke Manufacturing Company, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas.

Collaborations

Throughout his career, C Mark Nerby has collaborated with talented individuals, including Wayne S. Hoofnagle and Roger L. Howell. These partnerships have contributed to the success of his inventions and the advancement of technology in his field.

Conclusion

C Mark Nerby is a prominent figure in the realm of network testing technology, with a proven track record of innovation and collaboration. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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