Company Filing History:
Years Active: 2011
Title: **C David Baer: Innovator in Optical Measurement Technologies**
Introduction
C David Baer, based in Albuquerque, NM, is recognized for his remarkable contributions to the field of optical measurement. With a keen focus on advancing measurement systems, he holds a patent that reflects his innovative spirit and technical expertise.
Latest Patents
C David Baer is credited with a patent titled "Method and apparatus for obtaining the distance from an optical measurement instrument to an object under test." This invention presents systems and methods for accurately measuring the distance between a reference plane of an optical measurement instrument and a reference plane of an optical device under test. The system encompasses an illumination system designed to light the object under test, an optical system which captures and processes the light, and an optical sensor that detects the aberrated image. The processor plays a crucial role by determining the necessary distance based on the attributes of the collected aberrated image.
Career Highlights
Currently employed at Amo Wavefront Sciences, LLC, C David Baer has made significant strides in the field of optical technologies. His work focuses on developing advanced systems that enhance precision in optical measurements. His passion for innovation is evident in the solutions he has contributed to the field.
Collaborations
Throughout his career, C David Baer has collaborated with esteemed colleagues, including Daniel Ralph Neal and Richard James Copland. These partnerships have facilitated further advancements in optical measurement solutions and enhanced the capabilities of their projects.
Conclusion
C David Baer stands out as an inventive force in the optical measurement landscape. His patent work not only reflects his technical skills but also promises to influence the future of optical measurement technologies significantly. As he continues to innovate with his team at Amo Wavefront Sciences, he remains a key figure to watch in the evolution of this field.