Byungwook Jeong

Title: Byungwook Jeong and Wafer Testing Innovation.

Introduction

Byungwook Jeong is an inventor based in Cheonan, South Korea. His patent work includes a wafer testing apparatus designed to improve the alignment of testing equipment with a wafer. He is associated with Samsung Electronics Ltd.

Latest Patents

The available information identifies one patent for Jeong: “Wafer Testing Apparatus and Control Method Thereof.” The apparatus uses a camera to capture images of reference points on the probe board and wafer. A controller uses the image information to adjust the probe board’s tilt. The reference points are arranged in rhombic patterns on the board and wafer, supporting alignment during testing. Jeong’s listed portfolio includes 1 patent.

Career Highlights

Jeong’s documented patent contribution focuses on wafer-testing equipment and image-guided control. The invention addresses probe-board alignment, an important aspect of testing semiconductor wafers.

Collaborations

The provided information lists Chunghyun Kim and Cheolkyu Lim as Jeong’s coworkers. It does not specify their roles in the patent or whether they collaborated on the invention.

Conclusion

Byungwook Jeong’s listed patent reflects an engineering approach to wafer testing that combines camera-based imaging with automated tilt adjustment to support equipment alignment.