Seoul, South Korea

Byung-Wook Chin

This inventor holds 12 USPTO granted patents. Top assignees: Samsung Electronics Co., Ltd., Samsung Aerospace Industries, Ltd., Samsung Techwin Co., Ltd.. Active years: 2000-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Byung-Wook Chin. Retrieved from https://idiyas.com/inventor/byung-wook-chin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.5

ph-index = 3

Forward Citations = 61(Granted Patents)


Company Filing History:


Years Active: 2000-2016

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12 patents (USPTO):Explore Patents

Title: Byung-Wook Chin: Innovator in Camera Technology

Introduction

Byung-Wook Chin is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of camera technology, holding a total of 12 patents. His work has been instrumental in advancing the capabilities of modern imaging devices.

Latest Patents

One of his latest patents focuses on innovative camera technology. This development showcases his commitment to enhancing the functionality and performance of cameras in various applications.

Career Highlights

Throughout his career, Byung-Wook Chin has worked with leading companies in the technology sector, including Samsung Electronics Co., Ltd. and Samsung Techwin Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking projects.

Collaborations

Byung-Wook Chin has collaborated with notable professionals in the industry, including Joo-Hyung Lee and Jörg Tragatschnig. These partnerships have fostered a creative environment that has led to innovative solutions in camera technology.

Conclusion

Byung-Wook Chin's contributions to camera technology and his extensive patent portfolio highlight his role as a key innovator in the field. His work continues to influence the development of advanced imaging solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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