Seoul, South Korea

Byung-Won On

This inventor holds 1 USPTO granted patent. Top assignees: Advanced Institutes of Convergence Technology, Industry Academic Cooperation Foundation of Yeungnam University. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Byung-Won On. Retrieved from https://idiyas.com/inventor/byung-won-on-ynwftu4i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Byung-Won On: Innovator in Database Methods

Introduction

Byung-Won On is a notable inventor based in Guro-gu, Seoul, South Korea. He has made significant contributions to the field of database technology, particularly with his innovative methods for enhancing data processing capabilities.

Latest Patents

Byung-Won On holds 1 patent for a "Database method for B+ tree based on PRAM." This method introduces a novel approach to managing B+ trees by dividing each node into two areas. The process of inserting, retrieving, and deleting key values is streamlined, enhancing both durability and data processing efficiency.

Career Highlights

Throughout his career, Byung-Won On has worked with esteemed organizations such as the Industry-Academic Cooperation Foundation of Yeungnam University and the Advanced Institutes of Convergence Technology. His experience in these institutions has allowed him to develop and refine his innovative database methods.

Collaborations

Byung-Won On has collaborated with notable colleagues, including Gyu Sang Choi and In Gyu Lee. Their combined expertise has contributed to advancements in database technology.

Conclusion

Byung-Won On's contributions to database methods exemplify the impact of innovative thinking in technology. His work continues to influence the field and enhance data processing capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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